The right material composition makes all the difference. It directly dictates the material’s final properties, including coating protective capabilities, durability, appearance and suitability for a specific application. From wear characteristics and thermal stability to mechanical strength and corrosion resistance, a powder’s chemical makeup is critical to its performance and ensuring the coating effectively protects the underlying substrate.
We offer two analysis techniques to measure and analyse materials composition:
Both analytical techniques are used to determine the elemental composition of materials, but they differ in their principles, strengths, and ideal applications.
A focused beam of electrons is used to scan the sample's surface. The interaction generates characteristic X-rays, which are analysed by an energy-dispersive detector for the elements present and their concentrations.
Sample is excited with a primary X-ray beam and emitted fluorescent X-rays. Diffracted by a crystal, the X-rays based on their wavelengths are separated, allowing for high resolution and precise quantification.
While SEM-EDS is preferable for analysing small features or specific points on a surface, WDXRF is preferable when high precision and accuracy is desired, especially for resolving peak overlaps. In many cases, combining both techniques can provide a more comprehensive understanding of a material’s composition and structure, leveraging the strengths of each method.
Depending on your specific analytical needs, we can help you decide between SEM-EDS and WDXRF. WDXRF and chemical analysis of Carbon (C), Oxygen (O), Nitrogen (N), and Sulfur (S) is performed by our trusted UKAS-accredited partner.